Statistical Control by Monitoring and Adjustment
Wydawnictwo: John Wiley & Sons
The book begins with a discussion of SPC as it was originally conceived by Dr. Walter A. Shewhart and Dr. W. Edwards Deming. Subsequent chapters outline the basics of the new integration of SPC and EPC, which is not available in other related books. Thorough coverage of time series analysis for forecasting, process dynamics, and non-stationary models is also provided, and these sections have been carefully written so as to require only an elementary understanding of mathematics. Extensive graphical explanations and computational tables accompany the numerous examples that are provided throughout each chapter, and a helpful selection of problems and solutions further facilitates understanding.
Statistical Control by Monitoring and Adjustment, Second Edition is an excellent book for courses on applied statistics and industrial engineering at the upper-undergraduate and graduate levels. It also serves as a valuable reference for statisticians and quality control practitioners working in industry.